MBLEM - FIB SEM, Solid Mechanics and Materials Group, Department of Engineering Science, University of Oxford
MBLEM – Multi Beam Laboratory for Engineering Microscopy
The MBLEM SRF provides advanced equipment for multimodal and multiscale characterisation of a vast range of materials, soft matter, and multifunctional devices. For further information, please contact Professor J.C. Tan https://eng.ox.ac.uk/people/jin-chong-tan/ or the Facility Administrator amanda.bradbury@eng.ox.ac.uk.
- Tescan LYRA3 dual-beam FIB-SEM (with EDS, EBSD) - https://www.tescan.com/product-portfolio/fib-sem/
- Cypher-ES atomic force microscope (environmental AFM) - https://afm.oxinst.com/products/cypher-afm-systems/cypher-es-environmental-afm
- Neaspec neaSNOM nearfield infrared nanospectroscopy and IR nanoimaging - https://www.neaspec.com
- Rigaku Miniflex X-ray powder diffractometer - https://rigaku.com/products/x-ray-diffraction-and-scattering/xrd/miniflex
- Nanoindenter KLA iMicro - https://www.kla.com/products/instruments/nanoindenters
- Spectrofluorometer Edinburgh Instruments FS-5 - https://www.edinst.com/product/fs5-spectrofluorometer/
- Renishaw inVia confocal Raman microscope - https://www.renishaw.com/en/invia-confocal-raman-microscope--6260?srsltid=AfmBOoom6xBgQD6B_xii_SJFHbaRGAGUMU3KpsesQvQCA-RsJNsmGlBk