Veeco Dimension 3100 Atomic Force Microscope (AFM)
Tapping Mode
Contact Mode
Piezo-response Force Microscopy
Force-Distance measurements
Microscopy Suite
Facilities and Equipment
Carl Zeiss Evo LS15 Variable Pressure Scanning Electron Microscope
SE, BSE, VPSE & EPSE detectore
Elemental X-ray Analysis
Electron Back Scatter Diffraction
Heating/cooling capabilities
In-situ Mechanical testing
Alicona Infinite Focus 3D Profilometer
5, 10, 20, 50, 100X objectives
Profile form, 3D-Form
Profile/Surface Roughness
2D Measurements & Automation
5kN and 2N tensile compression stages (Deben UK)
2, 20, 150, 660, 2000 & 5000N load cells
Heating/cooling module -50 - +150oC
Loading adaptors for bending, double torsion & Brazilian disk testing
In-situ EBSD & DIC capability
Compatible with all LIMA Microscopes
Specimen Preparation Lab
Hot & Cold mounting
Accurate cutting & grinding
Automatic polishing
Optical Microscopy - 5,10,20, 50, 100X objectives
Bright Field, Dark Field, Polarized Light
Microhardness testing
