Skip to main content
Back

TESCAN LYRA3 FEG-SEM

Cypher-ES Environmental AFM

The Cypher-ES Environmental AFM provides high-resolution nanoscale surface imaging and mechanical and electrical characterisation under controlled environmental conditions.

Capabilities

  • Nanoscale surface topography using tapping and contact modes

  • Nanoindentation and nanomechanical mapping (AM-FM)

  • Kelvin probe force microscopy (KPFM)

  • Piezoresponse force microscopy (PFM)

  • Controlled heating from 0 to 120 °C

  • Measurements in gas-flow and liquid environments

Equipment webpage: 

https://afm.oxinst.com/products/cypher-family-afms

In situ AFM imaging of hydroxyapatite mineralisation

Combined SEM and AFM imaging of nanoscale crystals

AFM-TFM mapping of nanoindented MOF surfaces

AFM characterisation of metal–organic frameworks

AFM imaging and nanoindentation

Multiscale microscopy and AFM characterisation

Related Publications

M. El Skafi, H. Vondracek, J.D. Taylor, G. Cinque, J.-C. Tan. Mechanical behavior of metal-organic framework monoliths with enhanced fracture toughness. Materials Today Nano 33 (2026) 100760. https://doi.org/10.1016/j.mtnano.2026.100760

OXIMS Research Facility (2026) · Engineering and Technology Building (ETB), Room 00.12 · Department of Engineering Science, University of Oxford · Enquiries: