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TESCAN LYRA3 FEG-SEM

Sample preparation

The OXIMS sample preparation area provides facilities for preparing materials for microscopy, diffraction and mechanical characterisation.

Capabilities

  • Hot and cold mounting

  • Precision cutting and sectioning

  • Grinding and polishing

  • Optical microscopy

  • Bright-field, dark-field and polarised-light imaging

  • Microhardness testing

Useful links: 

Metallographic grinding and polishing – Struers:

https://www.struers.com/en/Knowledge/Grinding-and-polishing

Metallographic mounting – Struers:

https://www.struers.com/en/knowledge/mounting

Related Publications

M. El Skafi, H. Vondracek, J.D. Taylor, G. Cinque, J.-C. Tan. Mechanical behavior of metal-organic framework monoliths with enhanced fracture toughness. Materials Today Nano 33 (2026) 100760. https://doi.org/10.1016/j.mtnano.2026.100760

OXIMS Research Facility (2026) · Engineering and Technology Building (ETB), Room 00.12 · Department of Engineering Science, University of Oxford · Enquiries: