Carl Zeiss EVO LS15 Variable Pressure SEM
Carl Zeiss EVO LS15 Variable Pressure SEM
The Carl Zeiss EVO LS15 variable pressure scanning electron microscope (SEM) enables high-quality imaging and microstructural characterisation of a wide range of materials, including samples that are difficult to examine under conventional high-vacuum conditions.
Capabilities:
Secondary electron (SE) and backscattered electron (BSE) imaging
Variable-pressure imaging using VPSE and EPSE detectors
Energy-dispersive X-ray spectroscopy (EDS) for elemental analysis
Electron backscatter diffraction (EBSD) for crystallographic characterisation
In-situ heating and cooling experiments
In-situ mechanical testing
Related Publications
M. Tkaczyk, K.I. Dragnevski, C.R. Siviour, G. Edwards. Novel microscopy-based approaches to study the film formation mechanism and associated mechanical response in polymer lattices. Journal of Microscopy 273 (2019) 163–168. https://doi.org/10.1111/jmi.12777
D. Nowell, K.I. Dragnevski, S.J. O'Connor. Investigation of fatigue crack models by micro-scale measurement of crack tip deformation. International Journal of Fatigue 115 (2018) 20–26. https://doi.org/10.1016/j.ijfatigue.2018.01.015
A. Pellegrino, M.J. Perez-Martin, K.I. Dragnevski, G. Zumpano, N. Petrinic. Temperature and strain rate dependent mechanical response of METCO 601 aluminium-polyester abradable seal coating. EPJ Web of Conferences 183 (2018) 04012. https://doi.org/10.1051/epjconf/201818304012