TESCAN LYRA3 FEG-SEM
Rigaku MiniFlex X-ray Diffractometer
The Rigaku MiniFlex X-ray diffractometer (XRD) provides rapid structural and phase characterisation of crystalline materials.
Capabilities
Phase identification and phase analysis
Crystal structure characterisation
Lattice parameter determination
Crystallite size and microstrain analysis
Quantitative phase analysis
Characterisation of powders and bulk solid samples
Equipment webpage:
https://rigaku.com/products/x-ray-diffraction-and-scattering/xrd/miniflex
Related Publications
M. El Skafi, H. Vondracek, J.D. Taylor, G. Cinque, J.-C. Tan. Mechanical behavior of metal-organic framework monoliths with enhanced fracture toughness. Materials Today Nano 33 (2026) 100760. https://doi.org/10.1016/j.mtnano.2026.100760
OXIMS Research Facility (2026) ·
Engineering and Technology Building (ETB), Room 00.12 ·
Department of Engineering Science, University of Oxford ·
Enquiries: